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The reduction of dislocations in oxygen implanted silicon‐on‐insulator layers by sequential implantation and annealing

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
JournalJournal of Applied Physics
Volume63
DOIs
StatePublished - May 15 1988
Externally publishedYes

Disciplines

  • Atomic, Molecular and Optical Physics
  • Physics
  • Mineral Physics

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