Sensitivity of TEM data on lightspeed to camera-length's voltage variation

David Osborn; Tianna McBroom; P. Fraundorf

doi:10.1017/S143192761701220X

Sensitivity of TEM data on lightspeed to camera-length's voltage variation

David Osborn
, Tianna McBroom
, P. Fraundorf

University of Missouri-St. Louis

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Microscopy and Microanalysis
Volume	23
DOIs	https://doi.org/10.1017/S143192761701220X
State	Published - Jan 7 2017

Disciplines

Analytical Chemistry
Materials Science and Engineering

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10.1017/S143192761701220XLicense: Unspecified

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title = "Sensitivity of TEM data on lightspeed to camera-length's voltage variation",

author = "David Osborn and Tianna McBroom and P. Fraundorf",

note = "Sensitivity of TEM data on lightspeed to camera-length's voltage variation - Volume 23 Issue S1 - David Osborn, Tianna McBroom, P. Fraundorf",

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T1 - Sensitivity of TEM data on lightspeed to camera-length's voltage variation

AU - Osborn, David

AU - McBroom, Tianna

AU - Fraundorf, P.

N1 - Sensitivity of TEM data on lightspeed to camera-length's voltage variation - Volume 23 Issue S1 - David Osborn, Tianna McBroom, P. Fraundorf

PY - 2017/1/7

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DO - 10.1017/S143192761701220X

M3 - Article

VL - 23

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Sensitivity of TEM data on lightspeed to camera-length's voltage variation

Disciplines

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