Probing the Dielectric Property of Organic Molecules at Solid–liquid Interfaces Using Reflection Second Harmonic Generation

Zhi Xu; Ying Dong

doi:10.1016/S0039-6028(99)01132-2

Probing the Dielectric Property of Organic Molecules at Solid–liquid Interfaces Using Reflection Second Harmonic Generation

Zhi Xu, Ying Dong

University of Missouri-St. Louis

Research output: Contribution to journal › Article › peer-review

Abstract

Reflection second harmonic generation (SHG) has been applied for the investigation of the dielectric constant of a submonolayer of organic molecules adsorbed at silica/CH3CN interfaces. We show that the ratio of dielectric constants (εm,2ω/εm,ω) of the interfacial molecular layer can be obtained from the ratio of SHG intensities (I2ω45°-S,R/I2ωS-P,R), and using the ratio of dielectric constants the linear susceptibility (χ(1)) and polarizability (α) of solute molecules at resonant frequency can be evaluated.

Original language	American English
Journal	Surface Science
Volume	445
DOIs	https://doi.org/10.1016/S0039-6028(99)01132-2
State	Published - Jan 1 2000

Disciplines

Atomic, Molecular and Optical Physics
Analytical Chemistry

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title = "Probing the Dielectric Property of Organic Molecules at Solid–liquid Interfaces Using Reflection Second Harmonic Generation",

abstract = " Reflection second harmonic generation (SHG) has been applied for the investigation of the dielectric constant of a submonolayer of organic molecules adsorbed at silica/CH3CN interfaces. We show that the ratio of dielectric constants (εm,2ω/εm,ω) of the interfacial molecular layer can be obtained from the ratio of SHG intensities (I2ω45°-S,R/I2ωS-P,R), and using the ratio of dielectric constants the linear susceptibility (χ(1)) and polarizability (α) of solute molecules at resonant frequency can be evaluated.",

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T1 - Probing the Dielectric Property of Organic Molecules at Solid–liquid Interfaces Using Reflection Second Harmonic Generation

AU - Xu, Zhi

AU - Dong, Ying

N1 - Reflection second harmonic generation (SHG) has been applied for the investigation of the dielectric constant of a submonolayer of organic molecules a...

PY - 2000/1/1

Y1 - 2000/1/1

N2 - Reflection second harmonic generation (SHG) has been applied for the investigation of the dielectric constant of a submonolayer of organic molecules adsorbed at silica/CH3CN interfaces. We show that the ratio of dielectric constants (εm,2ω/εm,ω) of the interfacial molecular layer can be obtained from the ratio of SHG intensities (I2ω45°-S,R/I2ωS-P,R), and using the ratio of dielectric constants the linear susceptibility (χ(1)) and polarizability (α) of solute molecules at resonant frequency can be evaluated.

AB - Reflection second harmonic generation (SHG) has been applied for the investigation of the dielectric constant of a submonolayer of organic molecules adsorbed at silica/CH3CN interfaces. We show that the ratio of dielectric constants (εm,2ω/εm,ω) of the interfacial molecular layer can be obtained from the ratio of SHG intensities (I2ω45°-S,R/I2ωS-P,R), and using the ratio of dielectric constants the linear susceptibility (χ(1)) and polarizability (α) of solute molecules at resonant frequency can be evaluated.

UR - https://www.sciencedirect.com/science/article/pii/S0039602899011322#!

U2 - 10.1016/S0039-6028(99)01132-2

DO - 10.1016/S0039-6028(99)01132-2

M3 - Article

VL - 445

JO - Surface Science

JF - Surface Science

ER -

Probing the Dielectric Property of Organic Molecules at Solid–liquid Interfaces Using Reflection Second Harmonic Generation

Abstract

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