Octahedral inclusions showing evidence of crystallinity in Czochralski silicon

P. Fraundorf; H.-D. Chiou; G.K. Fraundorf

doi:10.1016/0022-0248(86)90384-2

Octahedral inclusions showing evidence of crystallinity in Czochralski silicon

P. Fraundorf, H.-D. Chiou, G.K. Fraundorf

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Journal of Crystal Growth
Volume	76
DOIs	https://doi.org/10.1016/0022-0248(86)90384-2
State	Published - Aug 1 1986
Externally published	Yes

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title = "Octahedral inclusions showing evidence of crystallinity in Czochralski silicon",

author = "P. Fraundorf and H.-D. Chiou and G.K. Fraundorf",

note = "Jet etched transmission electron microscope specimens of experimentally grown Czochralski silicon reveal small (10 nm) structures which have weak stra...",

year = "1986",

month = aug,

day = "1",

doi = "10.1016/0022-0248(86)90384-2",

language = "American English",

volume = "76",

journal = "Journal of Crystal Growth",

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TY - JOUR

T1 - Octahedral inclusions showing evidence of crystallinity in Czochralski silicon

AU - Fraundorf, P.

AU - Chiou, H.-D.

AU - Fraundorf, G.K.

N1 - Jet etched transmission electron microscope specimens of experimentally grown Czochralski silicon reveal small (10 nm) structures which have weak stra...

PY - 1986/8/1

Y1 - 1986/8/1

UR - https://www.sciencedirect.com/science/article/pii/0022024886903842#!

U2 - 10.1016/0022-0248(86)90384-2

DO - 10.1016/0022-0248(86)90384-2

M3 - Article

VL - 76

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

ER -

Octahedral inclusions showing evidence of crystallinity in Czochralski silicon

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