High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films

Wentao Qin; W. Shih; J. Lib; W. James; H. Siriwardaneane; P. Fraundorf

doi:10.1557/PROC-520-217

High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films

Wentao Qin
, W. Shih
, J. Lib
, W. James
, H. Siriwardaneane
, P. Fraundorf

University of Missouri-St. Louis

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	MRS Proceedings
Volume	520
DOIs	https://doi.org/10.1557/PROC-520-217
State	Published - Jan 1 1998

Disciplines

Metallurgy
Materials Science and Engineering

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Cite this

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title = "High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films",

author = "Wentao Qin and W. Shih and J. Lib and W. James and H. Siriwardaneane and P. Fraundorf",

note = "High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films - Volume 520 - Wentao Qin, W. Shih, J. Lib, W. James, H. Siriwardaneane, P. Fraundorf",

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T1 - High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films

AU - Qin, Wentao

AU - Shih, W.

AU - Lib, J.

AU - James, W.

AU - Siriwardaneane, H.

AU - Fraundorf, P.

N1 - High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films - Volume 520 - Wentao Qin, W. Shih, J. Lib, W. James, H. Siriwardaneane, P. Fraundorf

PY - 1998/1/1

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M3 - Article

VL - 520

JO - MRS Proceedings

JF - MRS Proceedings

ER -

High-Resolution Transmission Electron Microscope Analysis of Tungsten Carbide Thin Films

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