Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer

Zhigang Han; Lei Chen; Zhi Xu

doi:10.1364/AIO.2012.JTu5A.11

Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer

Zhigang Han, Lei Chen, Zhi Xu

University of Missouri-St. Louis

Research output: Contribution to journal › Article › peer-review

Abstract

Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.

Original language	American English
Journal	Applied Industrial Optics: Spectroscopy, Imaging and Metrology
DOIs	https://doi.org/10.1364/AIO.2012.JTu5A.11
State	Published - Jan 1 2012

Disciplines

Materials Science and Engineering
Analytical Chemistry
Optics

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title = "Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer",

abstract = " Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.",

author = "Zhigang Han and Lei Chen and Zhi Xu",

note = "Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.",

year = "2012",

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day = "1",

doi = "10.1364/AIO.2012.JTu5A.11",

language = "American English",

journal = "Applied Industrial Optics: Spectroscopy, Imaging and Metrology",

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T1 - Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer

AU - Han, Zhigang

AU - Chen, Lei

AU - Xu, Zhi

N1 - Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.

PY - 2012/1/1

Y1 - 2012/1/1

N2 - Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.

AB - Transmittance spectral interferograms were obtained to understand the birefringence dispersion of quartz crystal. The interferograms have uniform background and modulation and were taken with 0.5 nm spectral resolution.

UR - https://www.osapublishing.org/abstract.cfm?URI=COSI-2012-JTu5A.11

U2 - 10.1364/AIO.2012.JTu5A.11

DO - 10.1364/AIO.2012.JTu5A.11

M3 - Article

JO - Applied Industrial Optics: Spectroscopy, Imaging and Metrology

JF - Applied Industrial Optics: Spectroscopy, Imaging and Metrology

ER -

Birefringence Dispersion Measured by Low-coherence Spectral Interferometry Using a Spectrophotometer

Abstract

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